charged-particle. A material of thi

charged-particle. A material of thickness of about 10 (multiply
by density to obtain thickness in can be considered to be a thin target
for commonly used beamenergies [267]. Therefore, the PIXE method
is limited to examining thin samples (1 mg or less) and aerosol droplets.
Background. As charged-particles lose energy they also emit photons
by the bremsstrahlung process discussed in section 3.3. This creates
a continuous background photon spectrum underlying the fluorescence
radiation of interest. The background is higher for lighter chargedparticles,
since heavy ones do not produce much bremsstrahlung. In
addition, electrons ejected and subsequently accelerated by the incident
charged-particles, also produce secondary bremsstrahlung radiation that
further adds to the background component. The recoil-electrons that
are produced by the Compton scattering of the emitted x-rays can also
contribute to the background continuum. In light elements, nucleus activation
can occur, producing its own photon emission, as for example in
the 511 keV photons produced by fluorine in teflon via the
reaction, see Table 8.7. The gamma-rays emitted in such a reaction produce
a continuous background component by scattering within the target
and the surroundings. Every effort should made to reduce these, and
other possible sources of background effects, to increase the signal-tobackground
ratio and obtain good indications for fluorescence emission.
Ionoluminescence. X-rays emitted by PIXE are simultaneously accompanied
by luminescent light, which has a frequency extending from
that of infrared to that of ultraviolet [273]. This light, called ionoluminescence,
can be used for the detection of rare-earth elements, as the
luminescence emission lines from such elements are sharp, stable and
have a high yield in a variety of elements [274].

Kết quả (Việt) 1:

charged-particle. A material of thickness of about 10 (multiplyby density to obtain thickness in can be considered to be a thin targetfor commonly used beamenergies [267]. Therefore, the PIXE methodis limited to examining thin samples (1 mg or less) and aerosol droplets.Background. As charged-particles lose energy they also emit photonsby the bremsstrahlung process discussed in section 3.3. This createsa continuous background photon spectrum underlying the fluorescenceradiation of interest. The background is higher for lighter chargedparticles,since heavy ones do not produce much bremsstrahlung. Inaddition, electrons ejected and subsequently accelerated by the incidentcharged-particles, also produce secondary bremsstrahlung radiation thatfurther adds to the background component. The recoil-electrons thatare produced by the Compton scattering of the emitted x-rays can alsocontribute to the background continuum. In light elements, nucleus activationcan occur, producing its own photon emission, as for example inthe 511 keV photons produced by fluorine in teflon via thereaction, see Table 8.7. The gamma-rays emitted in such a reaction producea continuous background component by scattering within the targetand the surroundings. Every effort should made to reduce these, andother possible sources of background effects, to increase the signal-tobackgroundratio and obtain good indications for fluorescence emission.Ionoluminescence. Chụp x-quang phát ra từ PIXE đồng thời đi kèm vớibởi ánh sáng huỳnh quang, trong đó có một tần số kéo dài từlà hồng ngoại của tia cực tím [273]. Này ionoluminescence ánh sáng, được gọi là,có thể được sử dụng để phát hiện các nguyên tố đất hiếm-, như cácđây vạch bức xạ từ các yếu tố được sắc nét, ổn định vàcó một năng suất cao trong một loạt các yếu tố [274].